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We license technology and provide consultation in functional materials, and are open for joint R&D projects - for instance projects applying the materials in multilayer devices.

 

Our IPR covers granted methods, device and materials patents. Device patents include multistate memory patent. Modelling and analyzing of data collected on nanophase materials by scattering techniques deviates from the standard methods, which is why we developed our own methods and computer codes. We can realistically model the measurement data collected on multilayer structures. For instance, composition gradients, interfaces and domains must be considered in a precise modeling.

 

We have verified a broad range of new thin film compounds grown on substrates commonly applied in semiconductor industry and optoelectronics. Our expertise is based on tens of years of experience on solid state physics and chemistry of electronic materials.