We license technology and provide consultation in functional materials, and are open for joint R&D&I projects - for example projects which apply materials in multilayer devices.

 
Our IPR includes issued process, device and material patents. Device patents include a multistate memory patent. Modeling and analysis of data collected on nanophase materials by scattering techniques differs from standard methods, so we have developed our own methods and computer codes. We can realistically model X-ray data collected on multilayer structures and devices. For example, arbitrary composition gradients, interfaces, and domains must be taken into account for accurate modeling. Examples are available.

 Modeling of defects is critical in nanoelectronics, and is routinely conducted by our software.

We have verified a wide range of new thin film compounds grown on substrates commonly used in the semiconductor industry and optoelectronics. Our expertise is based on decades of experience in solid state physics and chemistry of electronic materials.